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Number of items: 3.

Kraft, D. ; Thissen, A. ; Broetz, Joachim ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces. (Publisher's Version)
In: Journal of Applied Physics, 94 (5), pp. 3589-3598. AIP Publishing, ISSN 0021-8979, e-ISSN 1089-7550,
DOI: 10.26083/tuprints-00019908,
[Article]

Fritsche, R. ; Wisotzki, E. ; Islam, A. B. M. O. ; Thissen, A. ; Klein, Andreas ; Jaegermann, Wolfram ; Rudolph, R. ; Tonti, D. ; Pettenkofer, C. (2021):
Electronic passivation of Si(111) by Ga–Se half-sheet termination. (Publisher's Version)
In: Applied Physics Letters, 80 (8), pp. 1388-1390. AIP Publishing, ISSN 0003-6951, e-ISSN 1077-3118,
DOI: 10.26083/tuprints-00019835,
[Article]

Liu, Guangming ; Schulmeyer, T. ; Thissen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
In situ preparation and interface characterization of TiO₂/Cu₂S heterointerface. (Publisher's Version)
In: Applied Physics Letters, 82 (14), pp. 2269-2271. AIP Publishing, ISSN 0003-6951, e-ISSN 1077-3118,
DOI: 10.26083/tuprints-00019856,
[Article]

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