Kraft, D. ; Thissen, A. ; Broetz, Joachim ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces.
In: Journal of Applied Physics, 94 (5)
doi: 10.26083/tuprints-00019908
Article, Secondary publication, Publisher's Version

Fritsche, R. ; Wisotzki, E. ; Islam, A. B. M. O. ; Thissen, A. ; Klein, Andreas ; Jaegermann, Wolfram ; Rudolph, R. ; Tonti, D. ; Pettenkofer, C. (2021)
Electronic passivation of Si(111) by Ga–Se half-sheet termination.
In: Applied Physics Letters, 80 (8)
doi: 10.26083/tuprints-00019835
Article, Secondary publication, Publisher's Version

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In situ preparation and interface characterization of TiO₂/Cu₂S heterointerface.
In: Applied Physics Letters, 82 (14)
doi: 10.26083/tuprints-00019856
Article, Secondary publication, Publisher's Version