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Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces

Kraft, D. ; Thissen, A. ; Broetz, Joachim ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces. (Publisher's Version)
In: Journal of Applied Physics, 94 (5), pp. 3589-3598. AIP Publishing, ISSN 0021-8979, e-ISSN 1089-7550,
DOI: 10.26083/tuprints-00019908,
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Item Type: Article
Origin: Secondary publication service
Status: Publisher's Version
Title: Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces
Language: English
Abstract:

We have studied the contact formation on CdTe surfaces following the technologically applied procedure. The electronic properties of wet chemically etched CdTe surfaces has been investigated with photoelectron spectroscopy. For the characterization of the morphology, structure, and elemental distribution in the etched layer atomic force microscopy, scanning electron microscopy, grazing incidence x-ray diffraction, and secondary ion mass spectroscopy have been used. Etching of the samples has been performed in air and in an electrochemistry chamber directly attached to the UHV system. In both cases the formation of an elemental polycrystalline Te layer with a thickness of about 80 Å is detected. For comparison, a thin Te layer has been deposited by physical vapor deposition onto a CdTe substrate. We determine a valence-band offset of ΔEVB=0.5±0.1 eV, independent of the preparation of the interface.

Journal or Publication Title: Journal of Applied Physics
Journal volume: 94
Number: 5
Publisher: AIP Publishing
Classification DDC: 500 Naturwissenschaften und Mathematik > 530 Physik
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Material Science > Surface Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
Date Deposited: 15 Nov 2021 13:13
Last Modified: 15 Nov 2021 13:13
DOI: 10.26083/tuprints-00019908
Corresponding Links:
URN: urn:nbn:de:tuda-tuprints-199084
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/19908
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