Article

Kraft, D. ; Thissen, A. ; Broetz, Joachim ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces.
In: Journal of Applied Physics, 2003, 94 (5)
doi: 10.26083/tuprints-00019908
Article, Secondary publication, Publisher's Version

Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces.
In: Applied Physics Letters, 2002, 81 (12)
doi: 10.26083/tuprints-00019886
Article, Secondary publication, Publisher's Version