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Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces

Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces. (Publisher's Version)
In: Applied Physics Letters, 81 (12), pp. 2297-2299. AIP Publishing, ISSN 0003-6951, e-ISSN 1077-3118,
DOI: 10.26083/tuprints-00019886,
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Item Type: Article
Origin: Secondary publication service
Status: Publisher's Version
Title: Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Language: English
Abstract:

The band alignment at polycrystalline CdS/CdTe heterointerfaces for thin-film solar cells is determined by photoelectron spectroscopy from stepwise CdTe deposition on polycrystalline CdS substrates and from subsequent sputter depth profiling. Identical values of 0.94±0.05 eV for the valence band offset are obtained.

Journal or Publication Title: Applied Physics Letters
Journal volume: 81
Number: 12
Publisher: AIP Publishing
Classification DDC: 500 Naturwissenschaften und Mathematik > 530 Physik
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 12 Nov 2021 13:42
Last Modified: 12 Nov 2021 13:42
DOI: 10.26083/tuprints-00019886
Corresponding Links:
URN: urn:nbn:de:tuda-tuprints-198860
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/19886
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