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Endres, Ralf :
Gate-Last-Prozessintegration und elektrische Bewertung von High-k-Dielektrika und Metall-Elektroden in MOS-Bauelementen.
 TU Darmstadt
[Ph.D. Thesis], (2011)

This list was generated on Sat May 25 15:22:40 2013 CEST.
OAI 2.0-Basis-URL: http://tuprints.ulb.tu-darmstadt.de/cgi/oai2 tuprints runs on EPrints 3.
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