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Nhu-Tarnawska, Hoa Kim Ngan ; Havela, Ladislav ; Adamska, A. M. ; Daniš, Stanislav ; Pešička, Josef ; Macl, J. ; Eloirdi, Rachel ; Huber, F. ; Gouder, T. ; Balogh, Adam Georg (2024)
Characterization of U-based thin films: the UFe₂₊ₓ case.
In: Journal of Physics: Conference Series, 2011, 303 (1)
doi: 10.26083/tuprints-00020752
Article, Secondary publication, Publisher's Version
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