Nhu-Tarnawska, Hoa Kim Ngan ; Havela, Ladislav ; Adamska, A. M. ; Daniš, Stanislav ; Pešička, Josef ; Macl, J. ; Eloirdi, Rachel ; Huber, F. ; Gouder, T. ; Balogh, Adam Georg (2024)
Characterization of U-based thin films: the UFe₂₊ₓ case.
In: Journal of Physics: Conference Series, 2011, 303 (1)
doi: 10.26083/tuprints-00020752
Article, Secondary publication, Publisher's Version
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| Item Type: | Article |
|---|---|
| Type of entry: | Secondary publication |
| Title: | Characterization of U-based thin films: the UFe₂₊ₓ case |
| Language: | English |
| Date: | 23 January 2024 |
| Place of Publication: | Darmstadt |
| Year of primary publication: | 2011 |
| Place of primary publication: | Bristol |
| Publisher: | IOP Publishing |
| Journal or Publication Title: | Journal of Physics: Conference Series |
| Volume of the journal: | 303 |
| Issue Number: | 1 |
| Collation: | 8 Seiten |
| DOI: | 10.26083/tuprints-00020752 |
| Corresponding Links: | |
| Origin: | Secondary publication DeepGreen |
| Abstract: | We have characterized UFe₂₊ₓ films prepared by sputter deposition onto fused silica (SiO₂) and Si(111) substrates with the film thickness ranging from 75 nm to 900 nm. The X-ray diffraction results showed an amorphous character of the deposited material. Some of the films showed in addition a pattern of highly textured cubic Laves phase. Rutherford Backscattering Spectroscopy with 2 MeV He⁺ ions has been used to determine the composition, thickness and concentration depth profile of the films. A large ageing affect was observed within 1 month after that the films were exposed to air. Magnetic measurements revealed TC increasing with relative Fe concentration and reaching approx. 450 K in UFe₃.₀. |
| Status: | Publisher's Version |
| URN: | urn:nbn:de:tuda-tuprints-207525 |
| Additional Information: | Joint European Magnetic Symposia – JEMS 2010 23–28 August 2010, Krakow, Poland |
| Classification DDC: | 500 Science and mathematics > 530 Physics 500 Science and mathematics > 540 Chemistry |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Material Analytics |
| Date Deposited: | 23 Jan 2024 10:05 |
| Last Modified: | 27 Feb 2024 11:57 |
| SWORD Depositor: | Deep Green |
| URI: | https://tuprints.ulb.tu-darmstadt.de/id/eprint/20752 |
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