TU Darmstadt / ULB / TUprints

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date
Number of items: 1.

Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces.
In: Applied Physics Letters, 81 (12)
doi: 10.26083/tuprints-00019886
Article, Secondary publication, Publisher's Version

This list was generated on Tue Feb 27 10:31:39 2024 CET.