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Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks. (Publisher's Version)
In: Micromachines, 13 (11), MDPI, e-ISSN 2072-666X,
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Gradual reset and set characteristics in yttrium oxide based resistive random access memory. (Publisher's Version)
In: Semiconductor Science and Technology, 34 (7), IOP Publishing, ISSN 0268-1242, e-ISSN 1361-6641,
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