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Aguirre, Fernando Leonel ; Piros, Eszter ; Kaiser, Nico ; Vogel, Tobias ; Petzold, Stephan ; Gehrunger, Jonas ; Oster, Timo ; Hochberger, Christian ; Suñé, Jordi ; Alff, Lambert ; Miranda, Enrique (2022):
Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks. (Publisher's Version)
In: Micromachines, 13 (11), MDPI, e-ISSN 2072-666X,
DOI: 10.26083/tuprints-00022979,
[Article]
Petzold, Stefan ; Piros, Eszter ; Sharath, Sankaramangalam Ulhas ; Zintler, Alexander ; Hildebrandt, Erwin ; Molina-Luna, Leopoldo ; Wenger, Christian ; Alff, Lambert (2021):
Gradual reset and set characteristics in yttrium oxide based resistive random access memory. (Publisher's Version)
In: Semiconductor Science and Technology, 34 (7), IOP Publishing, ISSN 0268-1242, e-ISSN 1361-6641,
DOI: 10.26083/tuprints-00019328,
[Article]