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Liu, Guangming ; Schulmeyer, T. ; Thissen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
In situ preparation and interface characterization of TiO₂/Cu₂S heterointerface.
In: Applied Physics Letters, 82 (14)
doi: 10.26083/tuprints-00019856
Article, Secondary publication, Publisher's Version

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