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Liu, Guangming ; Schulmeyer, T. ; Thissen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
In situ preparation and interface characterization of TiO₂/Cu₂S heterointerface. (Publisher's Version)
In: Applied Physics Letters, 82 (14), pp. 2269-2271. AIP Publishing, ISSN 0003-6951, e-ISSN 1077-3118,
DOI: 10.26083/tuprints-00019856,
[Article]

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