Browse by Person
![]() | Up a level |
Number of items: 1.
Ph.D. Thesis
Kerber, Andreas (2004):
Methodology for Electrical Characterization of MOS Devices with Alternative Gate Dielectrics.
Darmstadt, Technische Universität,
[Ph.D. Thesis]
![]() | Up a level |
Kerber, Andreas (2004):
Methodology for Electrical Characterization of MOS Devices with Alternative Gate Dielectrics.
Darmstadt, Technische Universität,
[Ph.D. Thesis]