TU Darmstadt / ULB / TUprints

Survey on Machine Learning Algorithms Enhancing the Functional Verification Process

Ismail, Khaled A. ; Ghany, Mohamed A. Abd El (2022)
Survey on Machine Learning Algorithms Enhancing the Functional Verification Process.
In: Electronics, 2022, 10 (21)
doi: 10.26083/tuprints-00020072
Article, Secondary publication, Publisher's Version

[img]
Preview
Text
electronics-10-02688.pdf
Copyright Information: CC BY 4.0 International - Creative Commons, Attribution.

Download (1MB) | Preview
Item Type: Article
Type of entry: Secondary publication
Title: Survey on Machine Learning Algorithms Enhancing the Functional Verification Process
Language: English
Date: 29 April 2022
Place of Publication: Darmstadt
Year of primary publication: 2022
Publisher: MDPI
Journal or Publication Title: Electronics
Volume of the journal: 10
Issue Number: 21
Collation: 24 Seiten
DOI: 10.26083/tuprints-00020072
Corresponding Links:
Origin: Secondary publication DeepGreen
Abstract:

The continuing increase in functional requirements of modern hardware designs means the traditional functional verification process becomes inefficient in meeting the time-to-market goal with sufficient level of confidence in the design. Therefore, the need for enhancing the process is evident. Machine learning (ML) models proved to be valuable for automating major parts of the process, which have typically occupied the bandwidth of engineers; diverting them from adding new coverage metrics to make the designs more robust. Current research of deploying different (ML) models prove to be promising in areas such as stimulus constraining, test generation, coverage collection and bug detection and localization. An example of deploying artificial neural network (ANN) in test generation shows 24.5× speed up in functionally verifying a dual-core RISC processor specification. Another study demonstrates how k-means clustering can reduce redundancy of simulation trace dump of an AHB-to-WHISHBONE bridge by 21%, thus reducing the debugging effort by not having to inspect unnecessary waveforms. The surveyed work demonstrates a comprehensive overview of current (ML) models enhancing the functional verification process from which an insight of promising future research areas is inferred.

Uncontrolled Keywords: automation of verification, functional verification, machine learning, coverage driven verification
Status: Publisher's Version
URN: urn:nbn:de:tuda-tuprints-200728
Classification DDC: 600 Technology, medicine, applied sciences > 600 Technology
600 Technology, medicine, applied sciences > 620 Engineering and machine engineering
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Integrated Electronic Systems (IES)
Date Deposited: 29 Apr 2022 08:53
Last Modified: 14 Nov 2023 19:04
SWORD Depositor: Deep Green
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/20072
PPN: 500233969
Export:
Actions (login required)
View Item View Item