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Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces

Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces.
In: Applied Physics Letters, 2002, 81 (12)
doi: 10.26083/tuprints-00019886
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Item Type: Article
Type of entry: Secondary publication
Title: Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Language: English
Date: 2021
Place of Publication: Darmstadt
Year of primary publication: 2002
Publisher: AIP Publishing
Journal or Publication Title: Applied Physics Letters
Volume of the journal: 81
Issue Number: 12
DOI: 10.26083/tuprints-00019886
Corresponding Links:
Origin: Secondary publication service
Abstract:

The band alignment at polycrystalline CdS/CdTe heterointerfaces for thin-film solar cells is determined by photoelectron spectroscopy from stepwise CdTe deposition on polycrystalline CdS substrates and from subsequent sputter depth profiling. Identical values of 0.94±0.05 eV for the valence band offset are obtained.

Status: Publisher's Version
URN: urn:nbn:de:tuda-tuprints-198860
Classification DDC: 500 Science and mathematics > 530 Physics
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 12 Nov 2021 13:42
Last Modified: 23 Jan 2023 07:14
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/19886
PPN: 503963682
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