Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021)
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces.
In: Applied Physics Letters, 81 (12)
doi: 10.26083/tuprints-00019886
Article, Secondary publication, Publisher's Version
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| Item Type: | Article |
|---|---|
| Type of entry: | Secondary publication |
| Title: | Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces |
| Language: | English |
| Date: | 2021 |
| Place of Publication: | Darmstadt |
| Publisher: | AIP Publishing |
| Journal or Publication Title: | Applied Physics Letters |
| Volume of the journal: | 81 |
| Issue Number: | 12 |
| DOI: | 10.26083/tuprints-00019886 |
| Corresponding Links: | |
| Origin: | Secondary publication service |
| Abstract: | The band alignment at polycrystalline CdS/CdTe heterointerfaces for thin-film solar cells is determined by photoelectron spectroscopy from stepwise CdTe deposition on polycrystalline CdS substrates and from subsequent sputter depth profiling. Identical values of 0.94±0.05 eV for the valence band offset are obtained. |
| Status: | Publisher's Version |
| URN: | urn:nbn:de:tuda-tuprints-198860 |
| Classification DDC: | 500 Science and mathematics > 530 Physics |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Surface Science |
| Date Deposited: | 12 Nov 2021 13:42 |
| Last Modified: | 23 Jan 2023 07:14 |
| URI: | https://tuprints.ulb.tu-darmstadt.de/id/eprint/19886 |
| PPN: | 503963682 |
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