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Gradual reset and set characteristics in yttrium oxide based resistive random access memory

Petzold, Stefan ; Piros, Eszter ; Sharath, Sankaramangalam Ulhas ; Zintler, Alexander ; Hildebrandt, Erwin ; Molina-Luna, Leopoldo ; Wenger, Christian ; Alff, Lambert (2021)
Gradual reset and set characteristics in yttrium oxide based resistive random access memory.
In: Semiconductor Science and Technology, 2021, 34 (7)
doi: 10.26083/tuprints-00019328
Article, Secondary publication, Publisher's Version

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Item Type: Article
Type of entry: Secondary publication
Title: Gradual reset and set characteristics in yttrium oxide based resistive random access memory
Language: English
Date: 6 September 2021
Place of Publication: Darmstadt
Year of primary publication: 2021
Publisher: IOP Publishing
Journal or Publication Title: Semiconductor Science and Technology
Volume of the journal: 34
Issue Number: 7
Collation: 6 Seiten
DOI: 10.26083/tuprints-00019328
Corresponding Links:
Origin: Secondary publication via sponsored Golden Open Access
Abstract:

This paper addresses the resistive switching behavior in yttrium oxide based resistive random access memory (RRAM) (TiN/yttrium oxide/Pt) devices. We report the coexistence of bipolar and unipolar resistive switching within a single device stack. For bipolar DC operation, the devices show gradual set and reset behavior with resistance ratio up to two orders of magnitude. By using nanosecond regime pulses (20 to 100 ns pulse width) of constant voltage amplitude, this gradual switching behavior could be utilized in tuning the resistance during set and reset spanning up to two orders of magnitude. This demonstrates that yttrium oxide based RRAM devices are alternative candidates for multibit operations and neuromorphic applications.

Status: Publisher's Version
URN: urn:nbn:de:tuda-tuprints-193289
Classification DDC: 600 Technology, medicine, applied sciences > 600 Technology
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
Date Deposited: 06 Sep 2021 12:09
Last Modified: 14 Nov 2023 19:03
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/19328
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