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Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer

Faridi, F. R. ; Preu, S. (2020)
Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer.
2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz).
doi: 10.25534/tuprints-00011364
Conference or Workshop Item, Secondary publication, Postprint

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Item Type: Conference or Workshop Item
Type of entry: Secondary publication
Title: Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer
Language: English
Date: January 2020
Place of Publication: Paris, France
Year of primary publication: 2019
Event Title: 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
DOI: 10.25534/tuprints-00011364
Corresponding Links:
Origin: Secondary publication
Uncontrolled Keywords: spectrometers;terahertz spectroscopy;terahertz isolator;reflection geometry;terahertz time domain spectroscopy;THz TDS;transmission geometry;1.5 port vector spectrometer;Isolators;Loss measurement;Insertion loss;Reflection;Frequency measurement;Time-domain analysis;Quantum cascade lasers
Status: Postprint
URN: urn:nbn:de:tuda-tuprints-113644
Additional Information:

Deutsche Forschungsgemeinschaft (DFG) funding project 278381540 (REPHCON)

Classification DDC: 500 Science and mathematics > 530 Physics
600 Technology, medicine, applied sciences > 600 Technology
600 Technology, medicine, applied sciences > 620 Engineering and machine engineering
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) > Terahertz Devices and Systems
Date Deposited: 24 Jan 2020 08:17
Last Modified: 22 Jun 2023 09:54
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/11364
PPN: 458902098
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