Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces. (Publisher's Version)
In: Applied Physics Letters, 81 (12), pp. 2297-2299. AIP Publishing, ISSN 0003-6951, e-ISSN 1077-3118,
DOI: 10.26083/tuprints-00019886,
[Article]
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| Item Type: | Article |
|---|---|
| Origin: | Secondary publication service |
| Status: | Publisher's Version |
| Title: | Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces |
| Language: | English |
| Abstract: | The band alignment at polycrystalline CdS/CdTe heterointerfaces for thin-film solar cells is determined by photoelectron spectroscopy from stepwise CdTe deposition on polycrystalline CdS substrates and from subsequent sputter depth profiling. Identical values of 0.94±0.05 eV for the valence band offset are obtained. |
| Journal or Publication Title: | Applied Physics Letters |
| Volume of the journal: | 81 |
| Issue Number: | 12 |
| Publisher: | AIP Publishing |
| Classification DDC: | 500 Naturwissenschaften und Mathematik > 530 Physik |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Surface Science |
| Date Deposited: | 12 Nov 2021 13:42 |
| Last Modified: | 12 Nov 2021 13:42 |
| DOI: | 10.26083/tuprints-00019886 |
| Corresponding Links: | |
| URN: | urn:nbn:de:tuda-tuprints-198860 |
| URI: | https://tuprints.ulb.tu-darmstadt.de/id/eprint/19886 |
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