Faridi, F. R. ; Preu, S. (2020)
Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer.
2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz).
doi: 10.25534/tuprints-00011364
Conference or Workshop Item, Secondary publication
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| Item Type: | Conference or Workshop Item |
|---|---|
| Type of entry: | Secondary publication |
| Title: | Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer |
| Language: | English |
| Date: | January 2020 |
| Place of Publication: | Paris, France |
| Year of primary publication: | 2019 |
| Event Title: | 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) |
| DOI: | 10.25534/tuprints-00011364 |
| Corresponding Links: | |
| Origin: | Secondary publication |
| Uncontrolled Keywords: | spectrometers;terahertz spectroscopy;terahertz isolator;reflection geometry;terahertz time domain spectroscopy;THz TDS;transmission geometry;1.5 port vector spectrometer;Isolators;Loss measurement;Insertion loss;Reflection;Frequency measurement;Time-domain analysis;Quantum cascade lasers |
| URN: | urn:nbn:de:tuda-tuprints-113644 |
| Additional Information: | Deutsche Forschungsgemeinschaft (DFG) funding project 278381540 (REPHCON) |
| Classification DDC: | 500 Naturwissenschaften und Mathematik > 530 Physik 600 Technik, Medizin, angewandte Wissenschaften > 600 Technik 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften und Maschinenbau |
| Divisions: | 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) > Terahertz Devices and Systems |
| Date Deposited: | 24 Jan 2020 08:17 |
| Last Modified: | 22 Jun 2023 09:54 |
| URI: | https://tuprints.ulb.tu-darmstadt.de/id/eprint/11364 |
| PPN: | 458902098 |
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