TU Darmstadt
ULB
TUprints
Browse by Person
Up a level |
Number of items: 1.
Sankaramangalam Ulhas, Sharath (2018)
Defect Engineering in HfO2/TiN-based Resistive Random Access Memory (RRAM) Devices by Reactive Molecular Beam Epitaxy.
Technische Universität Darmstadt
Ph.D. Thesis, Primary publication