TU Darmstadt / ULB / TUprints

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date
Number of items: 1.

Sankaramangalam Ulhas, Sharath (2018):
Defect Engineering in HfO2/TiN-based Resistive Random Access Memory (RRAM) Devices by Reactive Molecular Beam Epitaxy.
Darmstadt, Technische Universität, [Ph.D. Thesis]

This list was generated on Thu Dec 5 18:16:04 2019 CET.