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Ph.D. Thesis

Kerber, Andreas (2004):
Methodology for Electrical Characterization of MOS Devices with Alternative Gate Dielectrics.
Darmstadt, Technische Universität, [Online-Edition: http://elib.tu-darmstadt.de/diss/000404],
[Ph.D. Thesis]

This list was generated on Sun Jul 12 17:08:48 2020 CEST.