Maheu, Clément ; Zare Pour, Mohammad Amin ; Damestoy, Iban ; Ostheimer, David ; Mellin, Maximilian ; Moritz, Dominik C. ; Paszuk, Agnieszka ; Jaegermann, Wolfram ; Mayer, Thomas ; Hannappel, Thomas ; Hofmann, Jan P. (2023)
Tapered Cross Section Photoelectron Spectroscopy Provides Insights into the Buried Interfaces of III‐V Semiconductor Devices.
In: Advanced Materials Interfaces, 2023, 10 (3)
doi: 10.26083/tuprints-00023734
Article, Secondary publication, Publisher's Version