Ismail, Khaled A. ; Ghany, Mohamed A. Abd El (2022)
Survey on Machine Learning Algorithms Enhancing the Functional Verification Process.
In: Electronics, 2022, 10 (21)
doi: 10.26083/tuprints-00020072
Article, Secondary publication, Publisher's Version
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Item Type: | Article |
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Type of entry: | Secondary publication |
Title: | Survey on Machine Learning Algorithms Enhancing the Functional Verification Process |
Language: | English |
Date: | 29 April 2022 |
Place of Publication: | Darmstadt |
Year of primary publication: | 2022 |
Publisher: | MDPI |
Journal or Publication Title: | Electronics |
Volume of the journal: | 10 |
Issue Number: | 21 |
Collation: | 24 Seiten |
DOI: | 10.26083/tuprints-00020072 |
Corresponding Links: | |
Origin: | Secondary publication DeepGreen |
Abstract: | The continuing increase in functional requirements of modern hardware designs means the traditional functional verification process becomes inefficient in meeting the time-to-market goal with sufficient level of confidence in the design. Therefore, the need for enhancing the process is evident. Machine learning (ML) models proved to be valuable for automating major parts of the process, which have typically occupied the bandwidth of engineers; diverting them from adding new coverage metrics to make the designs more robust. Current research of deploying different (ML) models prove to be promising in areas such as stimulus constraining, test generation, coverage collection and bug detection and localization. An example of deploying artificial neural network (ANN) in test generation shows 24.5× speed up in functionally verifying a dual-core RISC processor specification. Another study demonstrates how k-means clustering can reduce redundancy of simulation trace dump of an AHB-to-WHISHBONE bridge by 21%, thus reducing the debugging effort by not having to inspect unnecessary waveforms. The surveyed work demonstrates a comprehensive overview of current (ML) models enhancing the functional verification process from which an insight of promising future research areas is inferred. |
Uncontrolled Keywords: | automation of verification, functional verification, machine learning, coverage driven verification |
Status: | Publisher's Version |
URN: | urn:nbn:de:tuda-tuprints-200728 |
Classification DDC: | 600 Technology, medicine, applied sciences > 600 Technology 600 Technology, medicine, applied sciences > 620 Engineering and machine engineering |
Divisions: | 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Integrated Electronic Systems (IES) |
Date Deposited: | 29 Apr 2022 08:53 |
Last Modified: | 14 Nov 2023 19:04 |
SWORD Depositor: | Deep Green |
URI: | https://tuprints.ulb.tu-darmstadt.de/id/eprint/20072 |
PPN: | 500233969 |
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