Article

Schmidt, Niclas ; Kaiser, Nico ; Vogel, Tobias ; Piros, Eszter ; Karthäuser, Silvia ; Waser, Rainer ; Alff, Lambert ; Dittmann, Regina (2024)
Impact of Non‐Stoichiometric Phases and Grain Boundaries on the Nanoscale Forming and Switching of HfOₓ Thin Films.
In: Advanced Electronic Materials, 2024, 10 (4)
doi: 10.26083/tuprints-00027119
Article, Secondary publication, Publisher's Version

Petzold, Stefan ; Zintler, Alexander ; Eilhardt, Robert ; Piros, Eszter ; Kaiser, Nico ; Sharath, Sankaramangalam Ulhas ; Vogel, Tobias ; Major, Márton ; McKenna, Keith Patrick ; Molina‐Luna, Leopoldo ; Alff, Lambert (2024)
Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices.
In: Advanced Electronic Materials, 2019, 5 (10)
doi: 10.26083/tuprints-00017041
Article, Secondary publication, Publisher's Version

Winkler, Robert ; Zintler, Alexander ; Petzold, Stefan ; Piros, Eszter ; Kaiser, Nico ; Vogel, Tobias ; Nasiou, Déspina ; McKenna, Keith P. ; Molina‐Luna, Leopoldo ; Alff, Lambert (2023)
Controlling the Formation of Conductive Pathways in Memristive Devices.
In: Advanced Science, 2022, 9 (33)
doi: 10.26083/tuprints-00023711
Article, Secondary publication, Publisher's Version

Aguirre, Fernando Leonel ; Piros, Eszter ; Kaiser, Nico ; Vogel, Tobias ; Petzold, Stephan ; Gehrunger, Jonas ; Oster, Timo ; Hochberger, Christian ; Suñé, Jordi ; Alff, Lambert ; Miranda, Enrique (2022)
Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks.
In: Micromachines, 2022, 13 (11)
doi: 10.26083/tuprints-00022979
Article, Secondary publication, Publisher's Version

Ph.D. Thesis

Vogel, Tobias (2023)
Switching in Emerging Memories and their Response to Heavy Ion Irradiation.
Technische Universität Darmstadt
doi: 10.26083/tuprints-00023263
Ph.D. Thesis, Primary publication, Publisher's Version