Bieker, Johannes ; Forbes, Richard G. ; Wilfert, Stefan ; Schlaak, Helmut F. (2019):
Simulation-Based Model of Randomly Distributed Large-Area Field Electron Emitters.
7, In: IEEE Journal of the Electron Devices Society, pp. 997-1006. ISSN 2168-6734,
DOI: 10.1109/JEDS.2019.2940086,
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Item Type: | Article |
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Origin: | Secondary publication via sponsored Golden Open Access |
Title: | Simulation-Based Model of Randomly Distributed Large-Area Field Electron Emitters |
Language: | German |
Journal or Publication Title: | IEEE Journal of the Electron Devices Society |
Series Volume: | 7 |
Date Deposited: | 25 Oct 2019 14:25 |
Last Modified: | 21 Jan 2020 15:05 |
DOI: | 10.1109/JEDS.2019.2940086 |
URN: | urn:nbn:de:tuda-tuprints-92048 |
URI: | https://tuprints.ulb.tu-darmstadt.de/id/eprint/9204 |
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