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Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity

Zwiebler, M. ; Hamann-Borrero, J. E. ; Vafaee, M. ; Komissinskiy, P. ; Macke, S. ; Sutarto, R. ; He, F. ; Büchner, B. ; Sawatzky, G. A. ; Alff, L. ; Geck, J. (2023)
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: New Journal of Physics, 2015, 17 (8)
doi: 10.26083/tuprints-00020590
Article, Secondary publication, Publisher's Version

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Item Type: Article
Type of entry: Secondary publication
Title: Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity
Language: English
Date: 5 December 2023
Place of Publication: Darmstadt
Year of primary publication: 24 August 2015
Place of primary publication: London
Publisher: IOP Publishing
Journal or Publication Title: New Journal of Physics
Volume of the journal: 17
Issue Number: 8
Collation: 15 Seiten
DOI: 10.26083/tuprints-00020590
Corresponding Links:
Origin: Secondary publication DeepGreen

The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-ray energy is tuned to the absorption edge of a particular resonant site, this assumption may no longer be appropriate. For samples realizing lattice planes with and without resonant sites, the corresponding regions containing the sites at resonance will have optical properties very different from regions without those sites. In this situation, models assuming homogeneous optical properties throughout the material can fail to describe the reflectivity adequately. As we show here, resonant soft x-ray reflectivity is sensitive to these variations, even though the wavelength is typically large as compared to the atomic distances over which the optical properties vary. We have therefore developed a scheme for analyzing resonant soft x-ray reflectivity data, which takes the atomic structure of a material into account by ‘slicing’ it into atomic planes with characteristic optical properties. Using LaSrMnO₄ as an example, we discuss both the theoretical and experimental implications of this approach. Our analysis not only allows to determine important structural information such as interface terminations and stacking of atomic layers, but also enables to extract depth-resolved spectroscopic information with atomic resolution, thus enhancing the capability of the technique to study emergent phenomena at surfaces and interfaces.

Uncontrolled Keywords: reflectometry, thin films, oxides
Status: Publisher's Version
URN: urn:nbn:de:tuda-tuprints-205909
Classification DDC: 500 Science and mathematics > 530 Physics
500 Science and mathematics > 540 Chemistry
Divisions: 11 Department of Materials and Earth Sciences > Material Science
Date Deposited: 05 Dec 2023 10:09
Last Modified: 05 Dec 2023 10:09
SWORD Depositor: Deep Green
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/20590
PPN: 513769137
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