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A Double Mirror Stub Design of Broadband Planar Bias Tee for System on Chip Integration

Yadav, Rahul ; Preu, Sascha ; Penirschke, Andreas (2023)
A Double Mirror Stub Design of Broadband Planar Bias Tee for System on Chip Integration.
Mediterrannean Microwave Symposium (MMS). Pizzo Calabro, Italy (09.-13.05.2022)
doi: 10.26083/tuprints-00024231
Conference or Workshop Item, Secondary publication, Postprint

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Item Type: Conference or Workshop Item
Type of entry: Secondary publication
Title: A Double Mirror Stub Design of Broadband Planar Bias Tee for System on Chip Integration
Language: English
Date: 12 July 2023
Place of Publication: Darmstadt
Year of primary publication: 2022
Publisher: IEEE
Book Title: 2022 Microwave Mediterranean Symposium (MMS)
Collation: 4 Seiten
Event Title: Mediterrannean Microwave Symposium (MMS)
Event Location: Pizzo Calabro, Italy
Event Dates: 09.-13.05.2022
DOI: 10.26083/tuprints-00024231
Corresponding Links:
Origin: Secondary publication service
Abstract:

Terahertz (THz) domain is quickly developing with various applications such as beam diagnostics at particle accelerators, spectroscopy, communications, space science, etc. However, often requiring fast intermediate frequency (IF) electronics. We present the design of a double mirror stub (DMS) based a planar broadband bias tee having an isolation port S 31 with 14.45 GHz bandwidth below −10 dB and S 33 with 13.1 GHz bandwidth above −2 dB. CST simulation and measured results are in very good agreement. The bias tee will be a part of a new generation of on-chip THz detectors based on zero-bias Schottky diode and high electron mobility field effect transistor (HEMT).

Status: Postprint
URN: urn:nbn:de:tuda-tuprints-242313
Classification DDC: 500 Science and mathematics > 530 Physics
600 Technology, medicine, applied sciences > 621.3 Electrical engineering, electronics
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP)
Date Deposited: 12 Jul 2023 13:18
Last Modified: 05 Dec 2023 06:20
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/24231
PPN: 510543766
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