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Energy band alignment at the nanoscale

Deuermeier, Jonas ; Fortunato, Elvira ; Martins, Rodrigo ; Klein, Andreas (2021):
Energy band alignment at the nanoscale. (Publisher's Version)
In: Applied Physics Letters, 110 (5), AIP Publishing, ISSN 0003-6951, e-ISSN 1077-3118,
DOI: 10.26083/tuprints-00019852,
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Item Type: Article
Origin: Secondary publication service
Status: Publisher's Version
Title: Energy band alignment at the nanoscale
Language: English
Abstract:

The energy band alignments at interfaces often determine the electrical functionality of a device. Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few Ångström thin. This is demonstrated with experimental data of Cu₂O on different kinds of substrate materials.

Journal or Publication Title: Applied Physics Letters
Journal volume: 110
Number: 5
Publisher: AIP Publishing
Collation: 4 Seiten
Classification DDC: 500 Naturwissenschaften und Mathematik > 530 Physik
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Surface Science
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > D - Component properties > Subproject D3: Function and fatigue of oxide electrodes in organic light emitting diodes
Date Deposited: 11 Nov 2021 13:15
Last Modified: 11 Nov 2021 13:16
DOI: 10.26083/tuprints-00019852
Corresponding Links:
URN: urn:nbn:de:tuda-tuprints-198522
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/19852
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