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Study of electrical fatigue by defect engineering in organic light-emitting diodes

Gassmann, Andrea ; Yampolskii, Sergey V. ; Klein, Andreas ; Albe, Karsten ; Vilbrandt, Nicole ; Pekkola, Oili ; Genenko, Yuri A. ; Rehahn, Matthias ; Seggern, Heinz von (2021):
Study of electrical fatigue by defect engineering in organic light-emitting diodes. (Publisher's Version)
In: Materials Science and Engineering: B, 192, pp. 26-51. Elsevier, ISSN 0921-5107,
DOI: 10.26083/tuprints-00019785,
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Item Type: Article
Origin: Secondary publication service
Status: Publisher's Version
Title: Study of electrical fatigue by defect engineering in organic light-emitting diodes
Language: English
Abstract:

In this work the current knowledge on the electrical degradation of polymer-based light-emitting diodes is reviewed focusing especially on derivatives of poly(p-phenylene-vinylene) (PPV). The electrical degradation will be referred to as electrical fatigue and is understood as mechanisms, phenomena and material properties that change during continuous operation of the device at constant current. The focus of this review lies especially on the effect of chemical synthesis on the transport properties of the organic semiconductor and the device lifetimes. In addition, the prominent transparent conductive oxide indium tin oxide as well as In₂O₃ will be reviewed and how their properties can be altered by the processing conditions. The experiments are accompanied by theoretical modeling shining light on how the change of injection barriers, charge carrier mobility or trap density influence the current–voltage characteristics of the diodes and on how and which defects form in transparent conductive oxides used as anode.

Journal or Publication Title: Materials Science and Engineering: B
Journal volume: 192
Publisher: Elsevier
Classification DDC: 600 Technik, Medizin, angewandte Wissenschaften > 600 Technik
600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Electronic Materials
Date Deposited: 28 Oct 2021 12:26
Last Modified: 28 Oct 2021 12:27
DOI: 10.26083/tuprints-00019785
Corresponding Links:
URN: urn:nbn:de:tuda-tuprints-197852
URI: https://tuprints.ulb.tu-darmstadt.de/id/eprint/19785
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