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Ph.D. Thesis

Wahl, Claudia (2002):
Charakterisierung innerer Grenzflächen in mikrokristallinem SiO2 mit Transmissionselektronenmikroskopie.
Darmstadt, Technische Universität, [Online-Edition: http://elib.tu-darmstadt.de/diss/000197],
[Ph.D. Thesis]

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